40 publications

2026

Sparsity Curse: Understanding RLVR Model Parameter Space from Model Merging

C. Wu, Z. Li, J. Bu, J. Liu, H. Wang

ACM SIGKDD · 2026

2025

2024

Digital Phenotyping and Feature Extraction on Smartphone Data for Depression Detection

M. Yang, E. C. H. Ngai, X. Hu, B. Hu, J. Liu, E. Gelenbe, V. C. M. Leung

Proceedings of the IEEE · 2024

2023

2022

2021

2020